| Equipment we are using at Rood Technology
Test / Handling Equipment
- MIXED SIGNAL / ANALOG
- Teradyne microFLEX
- SZ M3650
- SZ M3610
- SZ M3000
- Credence DUO
- Under evaluation: Advantest, LTX, Schlumberger, Teradyne
- VLSI / LSI
- MEMORY
- Gravity and Pick & Place Handlers (3 temperatures)
- Wafer Probers, 4 up to 6", 8" (Room, HT)
Qualification / Reliability Testing
- Measuring Burn-In System
- High Temperature Operating Life Chambers
- Power Temperature Cycling Chambers
- Temperature Cycling Chambers
- Thermal Shock Chambers
- Temperature/Humidity Chambers
- HAST Chamber
- ESD Tester
- Gross / Fine Leak Tester
- Autoclave Tester
- PIND Tester
- Centrifuge
- Vibration
Failure / Technological Analysis
- Focused Ion Beam System (FIB)
- Scanning Acoustic Microscope (SAM)
- Scanning Electron Microscope (SEM)
- Photo Emission Microscope (EMI)
- LINK ISIS Material Analysis
- X-Ray Microscope
- Liquid Crystal Thermography
- Bond Pull and Die Shear Tester
- Plasma Etcher
- IC Backside Polishing Equipment
- Optical Microscope
- Precision Cross Section
- Probe Bench & Curve Tracer
Programming Equipment
Scanning Systems
Conditiong Equipment
Tape & Reel Systems
Bake Ovens
Dry Pack System
Burn-In Ovens
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