Still the most
effective screening or stress procedure for microelectronic components to
minimise early failure rates on board level is Burn-In.
Therefore Rood Technology provides dynamic and static Burn-In services using ovens
from Aehr and Heraeus. This enables early life failures to be detected as well as per-
forming extended life testing.
Burn-In boards are available for a variety of packages, or will be designed and built on
customer request.
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