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You are here: Home » Test & Service Division » Failure / Technological Analysis » Focused Ion Beam - FIB
 
   

 Focused Ion Beam - FIB

 
   
By installing a FIB-system of the latest generation, combined with recruiting a FIB specialist with many years experience in circuit editing and other FIB related methods, Rood Technology with its long-lasting experience in Failure Analysis offers to IC manufacturers, fabless design houses, IC end users as well as universities and other service houses the capability of
  • Chip modification / circuit editing
  • Micro cross section
  • TEM lamella preparation
  • Micro-machining
  • Applications of material science
  • etc.

Herewith Rood Technology offers its customers already in the field of micro- and nanotechnology the possibility to do modifications, analysis and diagnoses.

This service is a further contribution of the consequent implementation of the company road map to support our customers regarding yield improvement and cost reduction.

Click for more technical details

 

 

   
 




Rood Testhouse International N.V. - Oettinger Str. 6 - 86720 Noerdlingen - Germany
Phone: +49 (0) 9081 - 804 - 0    Fax: +49 (0) 9081 - 804 -208
E-Mail: info@roodtechnology.com
 

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